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Calculate Capability Indices with Only One Specification

How do you calculate capability indices? Capability analysis is an essential tool for statistical process control (SPC) and ...
IndustryWeek

Medical Device Manufacturer Ditches ERP System for Statistical Process Control Software

A medical device manufacturer ditched a clunky ERP module for quality inspection, opting instead for specialized statistical process control software. Upgrading to new software costs time and money ...
JSTOR Daily

Statistical Process Control for Monitoring Scheduling Performance-Addressing the Problem of Correlated Data

In both manufacturing and service operations effective scheduling plays an important role in achieving delivery performance and in utilizing resources economically. Classical scheduling theory takes a ...
Semiconductor Engineering

Using Test And Metrology Data For Dynamic Process Control

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...
Electronic Design

Role of statistical process control in semiconductor yield management

There is a boom in the volume of semiconductor devices being manufactured, and the boom is primarily credited to the proliferation of Internet of Things (IoT)-based devices in our daily lives. IoT ...
Seeking Alpha

Onto Innovation Advances Process Control Suite for 3D Interconnect Yields

WILMINGTON, Mass.--(BUSINESS WIRE)-- Onto Innovation Inc. (ONTO) today announced advances in its product suite for 3D interconnect process control, featuring the new 3Di ™ technology on the Dragonfly ...