Korean researchers have developed a new analysis method capable of detecting “hidden defects” in semiconductors with a ...
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
BEIJING, Aug. 31, 2023 /PRNewswire/ -- WiMi Hologram Cloud Inc. (NASDAQ: WIMI) ("WiMi" or the "Company"), a leading global Hologram Augmented Reality ("AR") Technology provider, today announced that ...
As semiconductor chip technology advances towards nanometre and sub-nanometre scales, the demands becomes exponentially more ...
As semiconductor manufacturers aim to produce devices at the 5-nanometer node, the ability to find tiny defects created inadvertently during the fabrication process becomes harder. In addition, there ...
“Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive,” said Microtronic CEO Reiner Fenske in making the announcement. “Today’s fabs ...