Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
When light passes through a material, it often behaves in unpredictable ways. This phenomenon is the subject of “nonlinear optics”, which is now integral to technological and scientific advances – ...
Electron microscopy is a powerful technique that provides high-resolution images by focusing a beam of electrons to reveal fine structural details in biological and material specimens. 2 Because ...
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