Software defect prediction and quality assurance are critical fields in modern software engineering that focus on identifying error-prone components early in the development cycle. By utilising ...
A technical paper titled “Accelerating Defect Predictions in Semiconductors Using Graph Neural Networks” was published by researchers at Purdue University, Indian Institute of Technology (IIT) Madras, ...
Failure analysis (FA) is an essential step for achieving sufficient yield in semiconductor manufacturing, but it’s struggling to keep pace with smaller dimensions, advanced packaging, and new power ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback