The use of hierarchical DFT methods is growing as design size and complexity stresses memory requirements and design schedules. Hierarchical DFT divides the design into smaller pieces, creates test ...

Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...

Design-for-test (DFT) is essential to ensure that complex designs can be thoroughly tested. Testing demands continue to increase as designs grow in gate count and fabrication process technologies ...

Combining these Apps with an emulation environment makes it possible to increase fault coverage, increase production yield, and reduce ATE test time and cost. The design-for-test (DFT) technology was ...

This paper describes how using a smarter DFT infrastructure and automation can greatly improve the DFT schedule. A structural DFT infrastructure based on plug-and-play principles is used to enable ...

SoC sub-components (IPs) generally come from various sources – internal and external – and with that it has become necessary that designers ensure the RTL is testable. If the RTL has testability ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.